Tokyo, Japan (PRWEB)
July 31, 2017
Rigaku Corporation is pleased to announce the introduction of the new Rigaku ZSX Primus 400 sequential wavelength dispersive X- ray fluorescence (WDXRF) spectrometer. The new instrument was conceived specifically to handle very large and/or heavy samples and offers micro-mapping capabilities.
WDXRF analyzers are notable for high sensitivity and spectral resolution for non-destructive elemental analysis. The ZSX Primus 400 spectrometer was designed to adapt to varying, specific sample types and analysis needs. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg mass, the new system is ideally suited for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
All analytical capabilities of a traditional instrument are retained in this “large sample” variant, including measurement of beryllium (Be) through uranium (U) with high-resolution and precise WDXRF spectroscopic examination of samples from solids to liquids and powders to thin films.
For added flexibility, the new instrument offers a customized sample adapter system. With a variable measurement spot (30 mm to 0.5 mm diameter with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely versatile instrument was engineered to dramatically streamline quality control processes.
An available real-time camera allows the analysis point to be viewed on-screen, offering the operator complete certainty as to what is being measured.
The ZSX Primus 400 Windows® based software is user-friendly, yet powerful enough for the most complex analysis. Based on the Rigaku easy-to-use flow bar interface, the ZSX Guidance…